One of the several test programs floating around - this one is more comprehensive and verbose about electronics test than SNES Test Program but seems to feature less visual tests. It is possible that SNES Test Program was created and used in parallel to this cartridge due to the fact that STP features leftover data of an earlier version of Burn-In Test tool. Additionally, all of these tools seem to incorporate pieces of a simpler, Japanese controller test program.
Recorded with mednafen, snes core (snes_faust fails the test on EXT LATCH, HV TIMER and FIELD FLAG checks, and causes the program terminate on the initial screen, probably for debug).
